From: Robert Dick <dickrp_at_avoiding.spam>
Date: Sat, 26 Nov 2011 15:25:17 -0500

On Tuesday, we will finish with the survey by Bosschere et al. and cover a paper
on methods to use integrated circuits with very high fabrication error rates.
This paper looks at reliability in a different way than some of the other work
we have discussed. When reading it, please try to find ways that some of the
techniques described here could be extended to solve other problems in embedded
system reliability optimization.

Best Regards,

-Robert Dick-
Received on Sat Nov 26 2011 - 15:25:17 PST