Increasing circuit integration and power densities pose serious challenges while testing system-on-chip (SoC) and network-on- chip (NoC) integrated circuits (ICs). It is known that the maximum power consumption during testing is frequently several times higher than that during normal operation. High IC power consumption plus limited cooling support increases IC temperature, inducing damage and invalidating test results due to changes in path delay. Increasing process variation, and its impact on IC temperature, power consumption, and performance, further exacerbate the testing challenge. It is important to systematically consider thermal issues during the generation of test sequences and schedules, as well as during test application.

Our first work developes a optimal formulation the minimal-duration tmeperature-constrained test scheduling for MPSoCs (Multi-Processor Systems-on-Chip). Our results improve on the test schedule time of the best existing algorithm by 10.8% on average. We also develop an effecient heuristic that gnerally produces the same results as the optimal algorithm, while requiring little CPU time, even for large problem instances.

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